Multiple defocused coherent diffraction imaging: Method for simultaneously reconstructing objects and probe using X-ray free-electron lasers

Makoto Hirose, Kei Shimomura, Akihiro Suzuki, Nicolas Burdet, Yukio Takahashi

研究成果: Article査読

4 被引用数 (Scopus)

抄録

The sample size must be less than the diffraction-limited focal spot size of the incident beam in single-shot coherent X-ray diffraction imaging (CXDI) based on a diffract-before-destruction scheme using X-ray free electron lasers (XFELs). This is currently a major limitation preventing its wider applications. We here propose multiple defocused CXDI, in which isolated objects are sequentially illuminated with a divergent beam larger than the objects and the coherent diffraction pattern of each object is recorded. This method can simultaneously reconstruct both objects and a probe from the coherent X-ray diffraction patterns without any a priori knowledge. We performed a computer simulation of the prposed method and then successfully demonstrated it in a proof-of-principle experiment at SPring-8. The prposed method allows us to not only observe broad samples but also characterize focused XFEL beams.

本文言語English
ページ(範囲)11917-11925
ページ数9
ジャーナルOptics Express
24
11
DOI
出版ステータスPublished - 2016 5月 30
外部発表はい

ASJC Scopus subject areas

  • 原子分子物理学および光学

フィンガープリント

「Multiple defocused coherent diffraction imaging: Method for simultaneously reconstructing objects and probe using X-ray free-electron lasers」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル