TY - JOUR
T1 - Modification and control of topological insulator surface states using surface disorder
AU - Sacksteder, Vincent
AU - Ohtsuki, Tomi
AU - Kobayashi, Koji
N1 - Publisher Copyright:
© 2015 American Physical Society.
PY - 2015/6/11
Y1 - 2015/6/11
N2 - We numerically demonstrate a practical means of systematically controlling topological transport on the surface of a three-dimensional topological insulator, by introducing strong disorder in a layer of depth d extending inward from the surface of the topological insulator. The dependence on d of the density of states, conductance, scattering time, scattering length, diffusion constant, and mean Fermi velocity are investigated. The proposed control via disorder depth d requires that the disorder strength be near the large value which is necessary to drive the topological insulator into the nontopological phase. If d is patterned using masks, gates, ion implantation, etc., then integrated circuits may be fabricated. This technique will be useful for experiments and for device engineering.
AB - We numerically demonstrate a practical means of systematically controlling topological transport on the surface of a three-dimensional topological insulator, by introducing strong disorder in a layer of depth d extending inward from the surface of the topological insulator. The dependence on d of the density of states, conductance, scattering time, scattering length, diffusion constant, and mean Fermi velocity are investigated. The proposed control via disorder depth d requires that the disorder strength be near the large value which is necessary to drive the topological insulator into the nontopological phase. If d is patterned using masks, gates, ion implantation, etc., then integrated circuits may be fabricated. This technique will be useful for experiments and for device engineering.
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U2 - 10.1103/PhysRevApplied.3.064006
DO - 10.1103/PhysRevApplied.3.064006
M3 - Article
AN - SCOPUS:84951310386
SN - 2331-7019
VL - 3
JO - Physical Review Applied
JF - Physical Review Applied
IS - 6
M1 - 064006
ER -