Modeling and implementation of subthreshold characteristics of accumulation-mode MOSFETs for various SOI layer thickness and impurity concentrations

Rihito Kuroda, Akinobu Teramoto, W. Cheng, Shigetoshi Sugawa, T. Ohmi

研究成果: Conference contribution

3 被引用数 (Scopus)
本文言語English
ホスト出版物のタイトル2007 IEEE International SOI Conference Proceedings
ページ55-56
ページ数2
DOI
出版ステータスPublished - 2007 12 1
イベント2007 IEEE International Systems-on-Chip Conference, SOI - Indian Wells, CA, United States
継続期間: 2007 10 12007 10 4

出版物シリーズ

名前Proceedings - IEEE International SOI Conference
ISSN(印刷版)1078-621X

Other

Other2007 IEEE International Systems-on-Chip Conference, SOI
CountryUnited States
CityIndian Wells, CA
Period07/10/107/10/4

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

引用スタイル