@article{1de00a5c9fb240ad956aaa501a76f506,
title = "Mitigation of critical current degradation in mechanically loaded Nb 3Sn superconducting multi-strand cable",
abstract = "It was reported that Lorentz force caused degradation of critical current in the ITER-TFMC conductor. We have used our novel experimental setup, which utilizes the closed electric circuit concept for critical current and stability measurements of multi-stand superconducting cables. The feature of this setup is mechanical loading applied to the multi-strand cable in the transverse direction. Significant degradation in the critical current of the cable was observed when the average compressive stress was about 20 MPa. This degradation was found irreversible after unloading. We tested the cable with epoxy or ice molds as well. No degradation was observed in the molded cables. We also tested the cable with smaller void fraction. In this case, significant degradation in critical current was observed.",
keywords = "CICC, Critical current, Ice, NbSn, Superconducting multi-strand cables, Transverse load",
author = "K. Seo and A. Nishimura and Y. Hishinuma and K. Nakamura and T. Takao and G. Nishijima and K. Watanabe and K. Katagiri",
note = "Funding Information: Manuscript received August 28, 2007. Part of this work was supported by Grant-in-Aid for Scientific Research (#17656098 and #19360135) and Fusion Engineering Research Centre program at NIFS (NIFS06UCFF006) and Tohoku University collaboration program. K. Seo, A. Nishimura, and Y. Hishinuma are with the National Institute for Fusion Science, Japan (e-mail: seo@nifs.ac.jp). K. Nakamura and T. Takao are with Sophia University, Japan. G. Nishijima and K. Watanabe are with Tohoku University, Japan. K. Katagiri is with Iwate University, Japan. Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2008.920791",
year = "2008",
month = jun,
doi = "10.1109/TASC.2008.920791",
language = "English",
volume = "18",
pages = "491--494",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",
}