Minimally invasive examination methods using optical fiber

Yoichi Haga, Tadao Matsunaga

研究成果: Article › 査読

本文言語	English
ページ（範囲）	147-150
ページ数	4
ジャーナル	Journal of the Institute of Electrical Engineers of Japan
巻	136
号	3
DOI	https://doi.org/10.1541/ieejjournal.136.147
出版ステータス	Published - 2016 1 1

ASJC Scopus subject areas

@article{e34b745335864d71a6e0ebf643d95afc,

title = "Minimally invasive examination methods using optical fiber",

author = "Yoichi Haga and Tadao Matsunaga",

year = "2016",

month = jan,

day = "1",

doi = "10.1541/ieejjournal.136.147",

language = "English",

volume = "136",

pages = "147--150",

journal = "Journal of the Institute of Electrical Engineers of Japan",

issn = "1340-5551",

publisher = "The Institute of Electrical Engineers of Japan",

number = "3",

}

TY - JOUR

T1 - Minimally invasive examination methods using optical fiber

AU - Haga, Yoichi

AU - Matsunaga, Tadao

PY - 2016/1/1

Y1 - 2016/1/1

UR - http://www.scopus.com/inward/record.url?scp=84960364496&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84960364496&partnerID=8YFLogxK

U2 - 10.1541/ieejjournal.136.147

DO - 10.1541/ieejjournal.136.147

M3 - Article

AN - SCOPUS:84960364496

VL - 136

SP - 147

EP - 150

JO - Journal of the Institute of Electrical Engineers of Japan

JF - Journal of the Institute of Electrical Engineers of Japan

SN - 1340-5551

IS - 3

ER -