Microstructure analysis using visibility contrast in X-ray talbot interferometry

W. Yashiro, Y. Terui, K. Kawabata, A. Momose

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

We formulated reduction in visibility in the x-ray Talbot interferometer by the autocorrelation function of spatial fluctuations of a wavefront caused by unresolvable micron-size structures in a sample. The experimental results for several isotropic samples were well fitted by our formula with a simple model having three parameters characterizing the wavefront fluctuations: variance, correlation length, and the Hurst exponent. The Hurst exponent is relevant to the shapes of the microstructures, while the correlation length can be interpreted to their average size. Thus our results opens a new way to analyze microstructures in a sample.

本文言語English
ホスト出版物のタイトル10th International Conference on X-Ray Microscopy
ページ321-324
ページ数4
DOI
出版ステータスPublished - 2010 12 1
外部発表はい
イベント10th International Conference on X-Ray Microscopy - Chicago, IL, United States
継続期間: 2010 8 152010 8 20

出版物シリーズ

名前AIP Conference Proceedings
1365
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other10th International Conference on X-Ray Microscopy
国/地域United States
CityChicago, IL
Period10/8/1510/8/20

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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