Microscopic distribution of minor elements in iron-based alloys analyzed by secondary ion mass spectrometry

Rie Shishido, Masuo Itoh, Masahito Uchikoshi, Shigeru Suzuki

研究成果: Article査読

抄録

This paper overviews analytical results of the microscopic distribution of minor elements in iron-based alloys, obtained by secondary ion mass spectrometry (SIMS). Since trace amounts of some elements play crucial roles in the properties of steels, it is very important to analyze their distribution in the microstructure of iron-based alloys. Time of flight SIMS (TOF-SIMS) and conventional dynamic SIMS are powerful methods for detecting minor elements in iron-based alloys and analyzing their distribution in the microstructure of these materials. In this paper, we report several examples of the microscopic distribution of minor elements in iron-based alloys, which provide significant information on complicated phenomena related to the alloy microstructure. The depth profiles obtained by dynamic SIMS showed how a specific trace element penetrates the alloy matrix, indicating that the diffusion of the element is strictly related to the microstructure. On the other hand, high-sensitivity and high-spatial-resolution TOF-SIMS was used to characterize the microscopic distribution of trace elements, such as boron and nitrogen, in iron-based alloys, which is also related to the alloy microstructure.

本文言語English
ページ(範囲)150-155
ページ数6
ジャーナルe-Journal of Surface Science and Nanotechnology
16
DOI
出版ステータスPublished - 2018 5月 16

ASJC Scopus subject areas

  • バイオテクノロジー
  • バイオエンジニアリング
  • 凝縮系物理学
  • 材料力学
  • 表面および界面
  • 表面、皮膜および薄膜

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