Micromagnetic studies of ultrahigh resolution magnetic force microscope tip coated by soft magnetic materials

Jiangnan Li, Na Chen, Dan Wei, Masaaki Futamoto

    研究成果: Article査読

    7 被引用数 (Scopus)

    抄録

    Magnetic force microscope (MFM) tips coated by soft magnetic materials can achieve a spatial resolution above 10 nm. It is interesting to analyze why tips coated with soft magnetic materials can achieve such a high resolution. In experiment, an MFM tip coated by amorphous FeB can achieve a resolution of 8 nm; therefore, we chose an FeB tip as an example and establish a micromagnetic model to understand the measurement mechanism of the soft magnetic MFM tip. In the FeB film simulation, the random crystalline anisotropy results in a soft magnetic loop with an in-plane coercivity of 0.2 Oe, and the film surface roughness will raise the coercivity to the order of 1 Oe. In the tip simulation, it is found that the FeB-coated tip can be switched in a uniform field of the order of 100 Oe, but can remain near a remanent state in a stray field resulting from media. A simple model is set up to analyze the MFM images of bits in hard disk drivers using the simulated magnetic properties of the tip and resolution ∼ 10 nm is confirmed.

    本文言語English
    論文番号6851911
    ジャーナルIEEE Transactions on Magnetics
    51
    1
    DOI
    出版ステータスPublished - 2015 1 1

    ASJC Scopus subject areas

    • 電子工学および電気工学
    • 電子材料、光学材料、および磁性材料

    フィンガープリント

    「Micromagnetic studies of ultrahigh resolution magnetic force microscope tip coated by soft magnetic materials」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル