MeV gamma-ray observation with a well-defined point spread function based on electron tracking

A. Takada, T. Tanimori, H. Kubo, T. Mizumoto, Y. Mizumura, S. Komura, T. Kishimoto, T. Takemura, K. Yoshikawa, Y. Nakamasu, Y. Matsuoka, M. Oda, S. Miyamoto, S. Sonoda, D. Tomono, K. Miuchi, S. Kurosawa, T. Sawano

研究成果: Conference contribution

抄録

The field of MeV gamma-ray astronomy has not opened up until recently owing to imaging difficulties. Compton telescopes and coded-aperture imaging cameras are used as conventional MeV gamma-ray telescopes; however their observations are obstructed by huge background, leading to uncertainty of the point spread function (PSF). Conventional MeV gamma-ray telescopes imaging utilize optimizing algorithms such as the ML-EM method, making it difficult to define the correct PSF, which is the uncertainty of a gamma-ray image on the celestial sphere. Recently, we have defined and evaluated the PSF of an electron-tracking Compton camera (ETCC) and a conventional Compton telescope, and thereby obtained an important result: The PSF strongly depends on the precision of the recoil direction of electron (scatter plane deviation, SPD) and is not equal to the angular resolution measure (ARM). Now, we are constructing a 30 cm-cubic ETCC for a second balloon experiment, Sub-MeV gamma ray Imaging Loaded-on-balloon Experiment: SMILE-II. The current ETCC has an effective area of ∼1 cm2 at 300 keV, a PSF of ∼10° at FWHM for 662 keV, and a large field of view of ∼3 sr. We will upgrade this ETCC to have an effective area of several cm2 and a PSF of ∼5° using a CF4-based gas. Using the upgraded ETCC, our observation plan for SMILE-II is to map of the electron-positron annihilation line and the 1.8 MeV line from 26Al. In this paper, we will report on the current performance of the ETCC and on our observation plan.

本文言語English
ホスト出版物のタイトルSpace Telescopes and Instrumentation 2016
ホスト出版物のサブタイトルUltraviolet to Gamma Ray
編集者Marshall Bautz, Tadayuki Takahashi, Jan-Willem A. den Herder
出版社SPIE
ISBN(電子版)9781510601895
DOI
出版ステータスPublished - 2016
イベントSpace Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray - Edinburgh, United Kingdom
継続期間: 2016 6 262016 7 1

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
9905
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

Other

OtherSpace Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
国/地域United Kingdom
CityEdinburgh
Period16/6/2616/7/1

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

フィンガープリント

「MeV gamma-ray observation with a well-defined point spread function based on electron tracking」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル