Mesoscopic-scale and small strain field beneath SiO2/Si interface revealed by a multiple-wave X-ray diffraction phenomenon-depth of the strain field

Wataru Yashiro, Yoshitaka Yoda, Toshio Takahashi, Akinobu Teramoto, Takeo Hattori, Kazushi Miki

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Medicine & Life Sciences

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy