Mechanisms of stacking fault tetrahedra destruction by gliding dislocations in quenched gold

Y. Matsukawa, Y. N. Osetsky, R. E. Stoller, S. J. Zinkle

研究成果: Article査読

49 被引用数 (Scopus)

抄録

The destruction processes of stacking fault tetrahedra (SFTs) induced by gliding dislocations were examined by transmission electron microscopy (TEM) in situ straining experiments for SFTs with edge lengths ranging from 10 to 50 nm. At least four distinct SFT destruction processes were identified: (1) consistent with a Kimura-Maddin model for both screw and 60 dislocations, (2) stress-induced SFT collapse into a triangular Frank loop, (3) partial annihilation leaving an apex portion and (4) complete annihilation. Process (4) was observed at room temperature only for small SFTs (10 nm); however, this process was also frequently observed for larger SFTs (30 nm) at higher temperature (853 K). When this process was induced, the dislocation always cross-slipped, indicating only screw dislocations can induce this process.

本文言語English
ページ(範囲)581-597
ページ数17
ジャーナルPhilosophical Magazine
88
4
DOI
出版ステータスPublished - 2008 2月
外部発表はい

ASJC Scopus subject areas

  • 凝縮系物理学

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