抄録
A loosened connector between interconnected electric devices causes an increase in electromagnetic radiation when the devices operate in high-frequency bands. To develop a high-frequency circuit equivalent to a connector with contact failure, we previously investigated the parasitic elements caused by failure at the contact boundary. From the results of that study, the inductance and resistance at a connection contact boundary are increased by the loosening of a connector. Furthermore, the increase in inductance is the dominant factor in increasing the intensity of the electromagnetic radiation. In this paper, to suppress electromagnetic radiation resulting from a loose contact, we formulate the contact performance requirement needed to maintain a good contact condition when a small loosening has occurred at the interconnection. To this end, we investigate the mechanism of increase in the inductance by loosening the connector.
本文言語 | English |
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ページ(範囲) | 1502-1507 |
ページ数 | 6 |
ジャーナル | IEICE Transactions on Electronics |
巻 | E95-C |
号 | 9 |
DOI | |
出版ステータス | Published - 2012 9 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering