Measurements and Modelling of Noise in DC-Erased Thin-Film Media

Martin J. Vos, Yoichiro Tanaka, Jack H. Judy

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Experimental and theoretical results are given for the noise produced in thin-film media after reverse DC erasure. The noise spectra produced at high bit densities and at reverse DC erasure around the remanent coercivity look identical. A theoretical spectral model based on Poisson statistics shows a good fit with the measured noise spectra. A novel technique for measuring the medium noise in the spatial domain has been developed. The results obtained in the spatial domain through autocorrelation of the read flux agree well with the noise results obtained in the spectral domain.

本文言語English
ページ(範囲)2149-2151
ページ数3
ジャーナルIEEE Transactions on Magnetics
26
5
DOI
出版ステータスPublished - 1990 9
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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