Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, Zejun Ding

研究成果: Article査読

10 被引用数 (Scopus)

抄録

Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is difficult at electron energies below 50 eV, where core-level signals are too feeble to be detected against the strong secondary-electron background. Herein, a data-driven spectral analysis technique is used to study the low-energy electron-transport properties of substrate-supported target nanomaterials, while eliminating the influence of the substrate signal. Applying this technique, the electron-transport properties of the effective attenuation length and the inelastic mean free path (IMFP) can be determined with extremely high efficiency over the entire measured energy range of 6-600 eV. Further, these results show excellent agreement with other experimental and theoretical results. Significant differences are observed between monolayer graphene and the bulk graphite IMFP, which illustrates the importance of the nanometer effect in the electron-transport properties of the material. Furthermore, this technique is readily applicable to any ultrathin material that can be transferred onto a polycrystalline gold substrate.

本文言語English
論文番号e44055
ジャーナルPhysical Review Applied
13
4
DOI
出版ステータスPublished - 2020 4月
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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