TY - JOUR
T1 - Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene
AU - Da, Bo
AU - Sun, Yang
AU - Hou, Zhufeng
AU - Liu, Jiangwei
AU - Cuong, Nguyen Thanh
AU - Tsukagoshi, Kazuhito
AU - Yoshikawa, Hideki
AU - Tanuma, Shigeo
AU - Hu, Jin
AU - Gao, Zhaoshun
AU - Ding, Zejun
N1 - Funding Information:
We thank Dr. C. J. Powell, Professor Tarakura, and Professor Tanaka for helpful comments and discussions. We thank Professor M. S. Xu for providing the AES data for graphene on a substrate and graphene on a substrate. We thank Professor Homma for providing the EAL data of monolayer graphene measured using energy-filtered SEM. We thank Dr. Y. Ueda and Professor K. Watanabe for performing the TDDFT calculations. This work is supported by the “Materials Research by Information Integration” Initiative (MI2I) Project of the Support Program for Starting Up Innovation Hub from the Japan Science and Technology Agency (JST). K.T. is supported by a Grant-in-Aid (Grant No. 18K18868) from the Ministry of Education, Culture, Sports, Science and Technology (MEXT). J.H. is supported by the U.S. Department of Energy (DOE), Office of Science, Office of Basic Energy Sciences under Award DE-SC0019467. Z.J.D is supported by the National Natural Science Foundation of China (Grant No. 11574289) and Education Ministry through the “111” Project 2.0 (BP0719016). All DFT calculations are performed on the Numerical Materials Simulator supercomputer at the National Institute for Materials Science (NIMS).
Publisher Copyright:
© 2020 American Physical Society. © 2020 American Physical Society.
PY - 2020/4
Y1 - 2020/4
N2 - Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is difficult at electron energies below 50 eV, where core-level signals are too feeble to be detected against the strong secondary-electron background. Herein, a data-driven spectral analysis technique is used to study the low-energy electron-transport properties of substrate-supported target nanomaterials, while eliminating the influence of the substrate signal. Applying this technique, the electron-transport properties of the effective attenuation length and the inelastic mean free path (IMFP) can be determined with extremely high efficiency over the entire measured energy range of 6-600 eV. Further, these results show excellent agreement with other experimental and theoretical results. Significant differences are observed between monolayer graphene and the bulk graphite IMFP, which illustrates the importance of the nanometer effect in the electron-transport properties of the material. Furthermore, this technique is readily applicable to any ultrathin material that can be transferred onto a polycrystalline gold substrate.
AB - Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is difficult at electron energies below 50 eV, where core-level signals are too feeble to be detected against the strong secondary-electron background. Herein, a data-driven spectral analysis technique is used to study the low-energy electron-transport properties of substrate-supported target nanomaterials, while eliminating the influence of the substrate signal. Applying this technique, the electron-transport properties of the effective attenuation length and the inelastic mean free path (IMFP) can be determined with extremely high efficiency over the entire measured energy range of 6-600 eV. Further, these results show excellent agreement with other experimental and theoretical results. Significant differences are observed between monolayer graphene and the bulk graphite IMFP, which illustrates the importance of the nanometer effect in the electron-transport properties of the material. Furthermore, this technique is readily applicable to any ultrathin material that can be transferred onto a polycrystalline gold substrate.
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U2 - 10.1103/PhysRevApplied.13.044055
DO - 10.1103/PhysRevApplied.13.044055
M3 - Article
AN - SCOPUS:85085080213
VL - 13
JO - Physical Review Applied
JF - Physical Review Applied
SN - 2331-7019
IS - 4
M1 - e44055
ER -