Measurement of D0 lifetime in e+e- annihilation at high energy

H. Yamamoto, W. B. Atwood, P. H. Baillon, B. C. Barish, G. R. Bonneaud, A. Courau, G. J. Donaldson, R. Dubois, M. M. Duro, E. E. Elsen, S. G. Gao, Y. Z. Huang, G. M. Irwin, R. Johnson, H. Kichimi, J. Kirkby, D. E. Klem, D. E. Koop, J. Ludwig, G. B. MillsA. Ogawa, T. Pal, D. Perret-Gallix, R. Pitthan, D. L. Pollard, C. Y. Prescott, L. Z. Rivkin, L. S. Rochester, W. Ruckstuhl, M. Sakuda, S. Sherman, E. J. Siskind, R. Stroynowski, S. Q. Wang, S. G. Wojcicki, W. G. Yan, C. C. Young

研究成果: Article査読

6 被引用数 (Scopus)


A measurement of the D0 lifetime using the impact-parameter method is presented. The D0 sample is obtained from identified D* decays in e+e- annihilations into hadrons at center-of-mass energy of 29 GeV. The maximum-likelihood method used is found to be insensitive to the specific choice of cuts and uncertainties in backgrounds, giving the D0 lifetime of [4.61.5 (statistical)-0.5+0.6(systematic)]× 10-13 sec. The consistency and bias of the method are checked. Combining the measurement with the semileptonic branching ratio of D0, we estimate the semileptonic decay rate of D0 to be (1.60.6)×1011 sec-1. The corresponding value of the effective charm-quark mass is found to be consistent with the typical constituent mass of charm quark.

ジャーナルPhysical Review D
出版ステータスPublished - 1985

ASJC Scopus subject areas

  • 物理学および天文学(その他)


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