Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs

M. Nagata, S. Shimazaki, N. Azuma, S. Takahashi, M. Murakami, K. Hori, Satoshi Tanaka, M. Yamaguchi

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

In-band interferers in wireless communication channels are due to the high order harmonics of multiple clock frequencies used by baseband digital signal processing in a single-chip solution. The impacts of in-band spurious tones on wireless performance are explored with hardware-in-the-loop simulation (HILS) of the LTE compliant systems. RF receiver circuits fabricated in a 65 nm CMOS technology are involved in the HILS, for combining circuit-level interactions at the front end and system-level digital signal processing in the back end. Experiments exhibit the sensitivity of LTE communication throughput against substrate coupling noise from a digital noise emulator to the RF receiver circuits on the same chip. The observed response is equivalently confirmed with the input referred RF sinusoidal noise components intentionally added to the input RF signal with LTE modulation. The HILS enables hierarchical diagnosis of a wireless communication system from circuit-level interactions to system-level responses against noise coupling.

本文言語English
ホスト出版物のタイトルEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
出版社IEEE Computer Society
ページ37-41
ページ数5
ISBN(印刷版)9781479923151
DOI
出版ステータスPublished - 2013 1 1
外部発表はい
イベント9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013 - Nara, Japan
継続期間: 2013 12 152013 12 18

出版物シリーズ

名前EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits

Other

Other9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013
CountryJapan
CityNara
Period13/12/1513/12/18

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

フィンガープリント 「Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル