Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope

Kimitake Yamamoto, Norio Watanabe, Akihisa Takeuchi, Hidekazu Takano, Tatsuya Aota, Masanori Fukuda, Sadao Aoki

研究成果: Article査読

11 被引用数 (Scopus)

抄録

An X-ray fluorescence imaging microscope with a Wolter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (ΔE/E ≃ 10-4) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using two monochromatic X-rays above and below the absorption edge of a particular element, a two-dimensional image of the element could be obtained. As a result, two-dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite-quartz schist) became possible.

本文言語English
ページ(範囲)34-39
ページ数6
ジャーナルJournal of Synchrotron Radiation
7
1
DOI
出版ステータスPublished - 2000 1月 1
外部発表はい

ASJC Scopus subject areas

  • 放射線
  • 核物理学および高エネルギー物理学
  • 器械工学

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