1 被引用数 (Scopus)

抄録

Fault injection based on intentional electromagnetic interference (IEMI) is attracting considerable attention in the field of physical attacks on cryptographic devices due to its non-contact and non-invasive nature. This paper explores the relations between injection intensity and fault occurrence during IEMI-based fault injection. The basic idea in this type of attack is to generate a map of the effect of such fault injection for different frequencies. Based on the maps generated for an evaluation board, we demonstrate how an injected EM wave propagates across the board depending on its intensity and frequency. We also demonstrate in detail the propagation of induced EM waves inside the target module (i.e., a cryptographic LSI chip) and other modules. Through a map generation experiment, we examine the conditions under which transient faults suitable for attacks are generated in the cryptographic module. In addition, we discuss a possible countermeasure against IEMI-based fault injection.

本文言語English
ホスト出版物のタイトルProceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
ページ829-833
ページ数5
DOI
出版ステータスPublished - 2013 12 1
イベント2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 - Denver, CO, United States
継続期間: 2013 8 52013 8 9

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
ISSN(印刷版)1077-4076
ISSN(電子版)2158-1118

Other

Other2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
国/地域United States
CityDenver, CO
Period13/8/513/8/9

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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