Magnon excitation of CoFe/Al-oxide/CoFe ferromagnetic tunnel junctions

J. Murai, Y. Ando, T. Daibou, K. Yaoita, H. F. Han, T. Miyazaki

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Inelastic-electron-tunneling (IET) spectroscopy has been applied, to investigate the magnon-induced inelastic tunneling process for Ta/N 80Fe20/Cu/Ni80Fe20/IrMn/Co 75Fe25/Al-oxide/Co75Fe25/Ni 80Fe20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time, t0x = 40 s, which is the exact time to oxidize the 8 A Al, the subtraction spectrum of the IET spectra between the parallel and anti-parallel magnetization configurations clearly showed two peaks at + 3 and + 16 mV showed, On the other hand, the spectrum for the junction with tox = 120 s showed a broad, peak at around 1.8.mV and a plateau at zero-bias. This was caused by the change of the correlation, length of magnon inelastic excitation due to the over oxidation of the bottom electrode.

本文言語English
ページ(範囲)922-923
ページ数2
ジャーナルJournal of Magnetism and Magnetic Materials
226-230
PART I
DOI
出版ステータスPublished - 2001

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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