Magnetoresistance properties of cu/co/cu/nife multilayers with a few stacking numbers

Daisuke Mlyauchi, Satoru Araki

研究成果: Article査読

4 被引用数 (Scopus)

抄録

[Cu/Co/Cu/NiFe]N multilayers were prepared using electron-beam evaporation in an ultrahigh vacuum and their magnetoresistive (MR) properties with a few stacking numbers (N) were studied. The N dependence of the MR property was affected by the magnetic layer thickness. In the range of NS2, a thick magnetic layer was required to obtain a large MR ratio. In the multilayer of Cr(50 Å)/NiFe(50 Å)/Cu(50 Å)/Co(50 Å)/Cu(50 Å)/NiFe(50 Å) N=1.5), the MR ratio of 5.6% and the MR slope of 0.5%/Oe were obtained.

本文言語English
ページ(範囲)L31-L34
ジャーナルJapanese journal of applied physics
34
1
DOI
出版ステータスPublished - 1995 1月
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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