MAGNETIC SECTOR ATOM-PROBE FIELD ION MICROSCOPE WITH A RETARDING POTENTIAL ANALYZER.

Robert J. Culbertson, Toshio Sakurai

    研究成果: Article査読

    4 被引用数 (Scopus)

    抄録

    A combination of a magnetic sector atom-probe field ion microscope and a filter-lens-type retarding potential analyzer makes possible the investigation of the energy distribution of field desorption as well as field ionization and the field ion energy deficit with respect to the emitter potential on an absolute energy scale. The performance of this analyzer was evaluated using various imaging gases, and its resolution is estimated to be better than 100 meV out of a 2000 eV primary energy.

    本文言語English
    ページ(範囲)1752-1755
    ページ数4
    ジャーナルJournal of vacuum science & technology
    15
    5
    DOI
    出版ステータスPublished - 1978 9

    ASJC Scopus subject areas

    • Engineering(all)

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