Recording states of obliquely evaporated Co-O thin film media with different noise levels are observed by using ultrafine Co particles fabricated by a sputtering method. Very clear bit patterns with high resolution and high contrast are obtained by the method. This method enables us to estimate the fluctuation of magnetization transitions in the thin film media. It is also experimentally confirmed that the modulation noise level increases as fluctuation in the magnetization transitions become great.
|ジャーナル||Journal of Applied Physics|
|出版ステータス||Published - 1994|
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