Electron holography is used to visualize the electromagnetic field inside and outside a sample with high resolution. However, for analysis of nanocrystalline materials, difficulties related to electron diffraction are expected to arise due to the random orientation of the nanocrystallites. Here we present a procedure to extract magnetic field information from holograms and reduce the effect of electron diffraction by paying attention to the contrast of bright-field images. As a demonstration, the difference in the intensity of the magnetic flux between the Fe-Si-B-P-Cu amorphous matrix and Fe-rich body-centered cubic (bcc) nanocrystallites is detected with this procedure.
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