The recent advent of telecommunication usage demands the frequency of operation to be in X-band (8-10 GHz) in near future. Finding a suitable magnetic material that exhibits sufficiently high permeability with ferromagnetic resonance (FMR) frequency at that band is a huge challenge and, therefore, hindering the progress of devices like inductors and noise suppressors. The family of Hexaferrites is one of the most promising choices due to their reasonably high permeability and inherently large magnetocrystalline anisotropy that results in a very high FMR frequency. However, measurement of FMR frequency among other high frequency magnetic characteristics beyond 10 GHz is extremely tricky and error-prone. The problem escalates during the measurement of thin film. Among the various techniques, coplanar waveguide (CPW) based measurements are very simple but extremely sensitive to noise. One of the ways to improve signal to noise ratio is to reduce the CPW line-width so as to deliver more power along with the integration of magnetic layer directly on to it.