TY - GEN
T1 - Magnetic characterization of on-chip integrated layer of substituted Sr-M hexaferrite beyond 10 GHz
AU - Sai, R.
AU - Endo, Y.
AU - Shimada, Y.
AU - Naik, R.
AU - Bhat, N.
AU - Shivashankar, S. A.
AU - Yamaguchi, M.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/7/14
Y1 - 2015/7/14
N2 - The recent advent of telecommunication usage demands the frequency of operation to be in X-band (8-10 GHz) in near future. Finding a suitable magnetic material that exhibits sufficiently high permeability with ferromagnetic resonance (FMR) frequency at that band is a huge challenge and, therefore, hindering the progress of devices like inductors and noise suppressors.[1] The family of Hexaferrites is one of the most promising choices due to their reasonably high permeability and inherently large magnetocrystalline anisotropy that results in a very high FMR frequency.[2] However, measurement of FMR frequency among other high frequency magnetic characteristics beyond 10 GHz is extremely tricky and error-prone. The problem escalates during the measurement of thin film. Among the various techniques, coplanar waveguide (CPW) based measurements are very simple but extremely sensitive to noise.[3] One of the ways to improve signal to noise ratio is to reduce the CPW line-width so as to deliver more power along with the integration of magnetic layer directly on to it.
AB - The recent advent of telecommunication usage demands the frequency of operation to be in X-band (8-10 GHz) in near future. Finding a suitable magnetic material that exhibits sufficiently high permeability with ferromagnetic resonance (FMR) frequency at that band is a huge challenge and, therefore, hindering the progress of devices like inductors and noise suppressors.[1] The family of Hexaferrites is one of the most promising choices due to their reasonably high permeability and inherently large magnetocrystalline anisotropy that results in a very high FMR frequency.[2] However, measurement of FMR frequency among other high frequency magnetic characteristics beyond 10 GHz is extremely tricky and error-prone. The problem escalates during the measurement of thin film. Among the various techniques, coplanar waveguide (CPW) based measurements are very simple but extremely sensitive to noise.[3] One of the ways to improve signal to noise ratio is to reduce the CPW line-width so as to deliver more power along with the integration of magnetic layer directly on to it.
UR - http://www.scopus.com/inward/record.url?scp=84942475176&partnerID=8YFLogxK
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U2 - 10.1109/INTMAG.2015.7156658
DO - 10.1109/INTMAG.2015.7156658
M3 - Conference contribution
AN - SCOPUS:84942475176
T3 - 2015 IEEE International Magnetics Conference, INTERMAG 2015
BT - 2015 IEEE International Magnetics Conference, INTERMAG 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 IEEE International Magnetics Conference, INTERMAG 2015
Y2 - 11 May 2015 through 15 May 2015
ER -