Magnetic characterization of on-chip integrated layer of substituted Sr-M hexaferrite beyond 10 GHz

R. Sai, Y. Endo, Y. Shimada, R. Naik, N. Bhat, S. A. Shivashankar, M. Yamaguchi

研究成果: Conference contribution

抄録

The recent advent of telecommunication usage demands the frequency of operation to be in X-band (8-10 GHz) in near future. Finding a suitable magnetic material that exhibits sufficiently high permeability with ferromagnetic resonance (FMR) frequency at that band is a huge challenge and, therefore, hindering the progress of devices like inductors and noise suppressors.[1] The family of Hexaferrites is one of the most promising choices due to their reasonably high permeability and inherently large magnetocrystalline anisotropy that results in a very high FMR frequency.[2] However, measurement of FMR frequency among other high frequency magnetic characteristics beyond 10 GHz is extremely tricky and error-prone. The problem escalates during the measurement of thin film. Among the various techniques, coplanar waveguide (CPW) based measurements are very simple but extremely sensitive to noise.[3] One of the ways to improve signal to noise ratio is to reduce the CPW line-width so as to deliver more power along with the integration of magnetic layer directly on to it.

本文言語English
ホスト出版物のタイトル2015 IEEE International Magnetics Conference, INTERMAG 2015
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781479973224
DOI
出版ステータスPublished - 2015 7月 14
イベント2015 IEEE International Magnetics Conference, INTERMAG 2015 - Beijing, China
継続期間: 2015 5月 112015 5月 15

出版物シリーズ

名前2015 IEEE International Magnetics Conference, INTERMAG 2015

Other

Other2015 IEEE International Magnetics Conference, INTERMAG 2015
国/地域China
CityBeijing
Period15/5/1115/5/15

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学
  • 表面、皮膜および薄膜

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