Low temperature acoustic microscopy for material characterization

Kazushi Yamanaka; Yoshihiko Nagata; Toshio Koda; Koichi Karaki

Low temperature acoustic microscopy for material characterization

Kazushi Yamanaka, Yoshihiko Nagata, Toshio Koda, Koichi Karaki

未来科学技術共同研究センター

研究成果: Conference article › 査読

8 被引用数 (Scopus)

抄録

To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

本文言語	English
ページ（範囲）	913-920
ページ数	8
ジャーナル	Ultrasonics Symposium Proceedings
巻	2
出版ステータス	Published - 1990 12 1
イベント	Proceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA 継続期間: 1990 12 4 → 1990 12 7

ASJC Scopus subject areas

Engineering(all)

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引用スタイル

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abstract = "To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.",

author = "Kazushi Yamanaka and Yoshihiko Nagata and Toshio Koda and Koichi Karaki",

year = "1990",

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language = "English",

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T1 - Low temperature acoustic microscopy for material characterization

AU - Yamanaka, Kazushi

AU - Nagata, Yoshihiko

AU - Koda, Toshio

AU - Karaki, Koichi

PY - 1990/12/1

Y1 - 1990/12/1

N2 - To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

AB - To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

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VL - 2

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JO - Ultrasonics Symposium Proceedings

JF - Ultrasonics Symposium Proceedings

SN - 0090-5607

T2 - Proceedings of the IEEE 1990 Ultrasonics Symposium

Y2 - 4 December 1990 through 7 December 1990

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