Low temperature acoustic microscopy for material characterization

Kazushi Yamanaka, Yoshihiko Nagata, Toshio Koda, Koichi Karaki

研究成果: Conference article査読

8 被引用数 (Scopus)

抄録

To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

本文言語English
ページ(範囲)913-920
ページ数8
ジャーナルUltrasonics Symposium Proceedings
2
出版ステータスPublished - 1990 12 1
イベントProceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA
継続期間: 1990 12 41990 12 7

ASJC Scopus subject areas

  • Engineering(all)

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