To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.
|ジャーナル||Ultrasonics Symposium Proceedings|
|出版ステータス||Published - 1990 12 1|
|イベント||Proceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA|
継続期間: 1990 12 4 → 1990 12 7
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