Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

Ying Liu, Susumu Imashuku, Jun Kawai

研究成果: Article査読

1 被引用数 (Scopus)

抄録

An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm-2.

本文言語English
ページ(範囲)36-39
ページ数4
ジャーナルPowder Diffraction
30
1
DOI
出版ステータスPublished - 2015 10 21
外部発表はい

ASJC Scopus subject areas

  • Radiation
  • Materials Science(all)
  • Instrumentation
  • Condensed Matter Physics

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