抄録
The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.
本文言語 | English |
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ジャーナル | Japanese Journal of Applied Physics, Part 2: Letters |
巻 | 38 |
号 | 7 A |
出版ステータス | Published - 1999 1 1 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)