Laser interferometer using thin film photodetector

Minoru Sasaki, Xiaoyu Mi, Kazuhiro Hane

研究成果: Conference article査読


Novel thin film photodiode is proposed. The active layer is thinner than the wavelength of the incident light. A part of the incident light beam is detected and the rest passes through the thin film photodiode without the absorption. Being inserted in the optical field, this sensor can detect the intensity profile formed along the propagating direction of the laser beam. This function is applied to construct the new interferometer detecting the intensity profile of the standing wave produced by the incoming and the reflected laser beams.

ジャーナルProceedings of SPIE - The International Society for Optical Engineering
出版ステータスPublished - 1999
イベントProceedings of the 1999 Optoelectornic Integrated Circuits and Packaging III - San Jose, CA, USA
継続期間: 1999 1 281999 1 29

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学


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