A critical current density Jc and an irreversibility field Bi were measured for the low temperature growth (LTG) processed Sm1+xBa2-xCu3Oy films with and without Sm-rich123 nano-particles. The reduction of the resistivity and the small enhancement of Bi due to the c-axis correlated pinning were observed for both LTG-Sm123 films with and without nano-particles. These results suggest that the c-axis correlated pinning affects similarly the resistivity and the Bi properties regardless of the nano-particle addition. In the Jc properties of the nano-particles added sample, three peaks in the angular dependence of Jc at 77.3 K appear in addition to the intrinsic anisotropy described by the effective mass model. Those are a broad peak for B∥c, a sharp peak at B∥ab and a shoulder at about 20° off ab-plane. The broad peak at B∥c, which is related with the c-axis correlated pinning, decreases in low fields up to 3 T but increases again in a high field region with increasing a magnetic field. These behaviors may be connected to the enhancement of the Bi, which was obtained by the resistivity measurements. The global pinning force is scaled well in a low field region, but shifts to the low field direction in a high field region, with decreasing temperature.
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