TY - JOUR
T1 - Investigations of structural, dielectric and optical properties on silicon ion irradiated glycine monophosphate single crystals
AU - Thangavel, Kanagasekaran
AU - Mythili, P.
AU - Bhagavannarayana, G.
AU - Kanjilal, D.
AU - Gopalakrishnan, R.
PY - 2009/8/1
Y1 - 2009/8/1
N2 - The 50 MeV silicon ion irradiation induced modifications on structural, optical and dielectric properties of solution grown glycine monophosphate (GMP) crystals were studied. The high-resolution X-ray diffraction study shows the unaltered value of integrated intensity on irradiation. The dielectric constant as a function of frequency and temperature was studied. UV-visible studies reveal the decrease in bandgap values on irradiation and presence of F-centers. The fluorescence spectrum shows the existence of some energy levels, which remains unaffected after irradiation. The scanning electron micrographs reveal the defects formed on irradiation.
AB - The 50 MeV silicon ion irradiation induced modifications on structural, optical and dielectric properties of solution grown glycine monophosphate (GMP) crystals were studied. The high-resolution X-ray diffraction study shows the unaltered value of integrated intensity on irradiation. The dielectric constant as a function of frequency and temperature was studied. UV-visible studies reveal the decrease in bandgap values on irradiation and presence of F-centers. The fluorescence spectrum shows the existence of some energy levels, which remains unaffected after irradiation. The scanning electron micrographs reveal the defects formed on irradiation.
KW - Electrical properties
KW - Optical properties of clusters
KW - Scanning electron microscopy
KW - Single crystals
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U2 - 10.1016/j.nimb.2009.04.017
DO - 10.1016/j.nimb.2009.04.017
M3 - Article
AN - SCOPUS:67649996946
VL - 267
SP - 2495
EP - 2502
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
IS - 15
ER -