Investigation of mechanical and tribological properties of polyaniline brush by atomic force microscopy for scanning probe-based data storage

Shinya Yoshida, So Fujinami, Masayoshi Esashi

研究成果: Article査読

1 被引用数 (Scopus)

抄録

In this study, the mechanical and tribological properties of polyaniline (PANI) brush are investigated for ultrahigh density data storage system based on atomic force microscope (AFM). A 30-nm-thick PANI brush film is formed on an Au surface by the intermediary of a self-assembled monolayer. The average Young's modulus of the brush is successfully evaluated to be 3.8 GPa by force-deformation curve measurement. And main cause of the friction force between conductive Pt/Ir-coated tip and the brush in the tip scanning is found to be not adhesion force but the roughness by lateral force microscopy. Moreover, it is demonstrated that the PANI brush has better wear resistivity compared with a spin-deposited PMMA film as the recording medium. The good wear resistivity is attributed to the configuration of the polymer brush without physically-absorbed polymer chains.

本文言語English
ページ(範囲)53-59
ページ数7
ジャーナルe-Journal of Surface Science and Nanotechnology
11
DOI
出版ステータスPublished - 2013 4月 13

ASJC Scopus subject areas

  • バイオテクノロジー
  • バイオエンジニアリング
  • 凝縮系物理学
  • 材料力学
  • 表面および界面
  • 表面、皮膜および薄膜

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