Intrinsic Josephson junctions in c-axis-oriented La1.85Sr 0.15CuO4 thin films

Y. Mizugaki; Y. Uematsu; S. J. Kim; J. Chen; K. Nakajima; T. Yamashita; H. Sato; M. Naito

doi:10.1063/1.1595139

Intrinsic Josephson junctions in c-axis-oriented La_1.85Sr _0.15CuO₄ thin films

Y. Mizugaki, Y. Uematsu, S. J. Kim, J. Chen, K. Nakajima, T. Yamashita, H. Sato, M. Naito

研究成果: Article › 査読

11 被引用数 (Scopus)

抄録

The current-voltage characteristics (IVC) of intrinsic Josephson junctions (IJJ) in c-axis-oriented La_2-xSr_xCuO₄ (LSCO) thin films were demonstrated. The large intrinsic junctions (LIJ) with a mesa structure exhibited resistively shunted junction (RSJ)-like IVCs. The results indicated that the IJJs in the LSCO thin films are characterized as stacked SIS Josephson junctions and that the grain boundaries act as shunting resistance.

本文言語	English
ページ（範囲）	2534-2537
ページ数	4
ジャーナル	Journal of Applied Physics
巻	94
号	4
DOI	https://doi.org/10.1063/1.1595139
出版ステータス	Published - 2003 8月 15
外部発表	はい

ASJC Scopus subject areas

物理学および天文学（全般）

文献へのアクセス

10.1063/1.1595139

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引用スタイル

@article{db4719a03170478c887eb6dfaf5dd677,

title = "Intrinsic Josephson junctions in c-axis-oriented La1.85Sr 0.15CuO4 thin films",

abstract = "The current-voltage characteristics (IVC) of intrinsic Josephson junctions (IJJ) in c-axis-oriented La2-xSrxCuO4 (LSCO) thin films were demonstrated. The large intrinsic junctions (LIJ) with a mesa structure exhibited resistively shunted junction (RSJ)-like IVCs. The results indicated that the IJJs in the LSCO thin films are characterized as stacked SIS Josephson junctions and that the grain boundaries act as shunting resistance.",

author = "Y. Mizugaki and Y. Uematsu and Kim, {S. J.} and J. Chen and K. Nakajima and T. Yamashita and H. Sato and M. Naito",

year = "2003",

month = aug,

day = "15",

doi = "10.1063/1.1595139",

language = "English",

volume = "94",

pages = "2534--2537",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "4",

}

TY - JOUR

T1 - Intrinsic Josephson junctions in c-axis-oriented La1.85Sr 0.15CuO4 thin films

AU - Mizugaki, Y.

AU - Uematsu, Y.

AU - Kim, S. J.

AU - Chen, J.

AU - Nakajima, K.

AU - Yamashita, T.

AU - Sato, H.

AU - Naito, M.

PY - 2003/8/15

Y1 - 2003/8/15

N2 - The current-voltage characteristics (IVC) of intrinsic Josephson junctions (IJJ) in c-axis-oriented La2-xSrxCuO4 (LSCO) thin films were demonstrated. The large intrinsic junctions (LIJ) with a mesa structure exhibited resistively shunted junction (RSJ)-like IVCs. The results indicated that the IJJs in the LSCO thin films are characterized as stacked SIS Josephson junctions and that the grain boundaries act as shunting resistance.

AB - The current-voltage characteristics (IVC) of intrinsic Josephson junctions (IJJ) in c-axis-oriented La2-xSrxCuO4 (LSCO) thin films were demonstrated. The large intrinsic junctions (LIJ) with a mesa structure exhibited resistively shunted junction (RSJ)-like IVCs. The results indicated that the IJJs in the LSCO thin films are characterized as stacked SIS Josephson junctions and that the grain boundaries act as shunting resistance.

UR - http://www.scopus.com/inward/record.url?scp=0041922648&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0041922648&partnerID=8YFLogxK

U2 - 10.1063/1.1595139

DO - 10.1063/1.1595139

M3 - Article

AN - SCOPUS:0041922648

VL - 94

SP - 2534

EP - 2537

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 4

ER -