Interlayer exchange coupling dependence of thermal stability parameters in synthetic antiferromagnetic free layers

Y. Saito, H. Sugiyama, T. Inokuchi, K. Inomata

研究成果: Article査読

5 被引用数 (Scopus)

抄録

We conducted a detailed study of the interlayer exchange coupling (JEX) dependence of thermal stability properties of magnetic tunnel junctions (MTJs) with synthetic antiferromagnetic (Syn-AF) free layers. The thermal stability properties were investigated using the junction magnetoresistance of current-perpendicular MTJ devices with a word line as probes. The observed sweep-rate-dependent coercivities were analyzed using the Sharrock formula. The results confirmed the existence of strong JEX dependence on thermal stability parameters (Ku VkT) in Syn-AF free layers. The values of Ku VkT for MTJs with Syn-AF free layers decreased with a decrease in the strength of JEX, and the increase in the effective volume of the Syn-AF free layer disappeared at JEX ≤0.52 erg cm2. The Syn-AF free layer with JEX >0.52 erg cm2 is relevant for high-density spin electronic nanodevices with a low aspect ratio.

本文言語English
論文番号08K702
ジャーナルJournal of Applied Physics
99
8
DOI
出版ステータスPublished - 2006
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

フィンガープリント

「Interlayer exchange coupling dependence of thermal stability parameters in synthetic antiferromagnetic free layers」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル