Interferometry by coherent convergent-beam electron diffraction

Kenji Tsuda, Michiyoshi Tanaka

研究成果: Article査読

4 被引用数 (Scopus)

抄録

The interference fringes with a lattice spacing of 1.28 Å for the 220 reflection of cubic boron nitride (BN) have been observed in convergent-beam electron diffraction (CBED) patterns using a JEM-2010F electron microscope. It is demonstrated that the coherent CBED method acts as an interferometer when the two waves passing through both sides of an edge-on stacking fault are superposed coherently. The displacement vectors at stacking faults in Si and TiO2 have been measured.

本文言語English
ページ(範囲)59-63
ページ数5
ジャーナルJournal of Electron Microscopy
45
1
DOI
出版ステータスPublished - 1996

ASJC Scopus subject areas

  • 器械工学

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