Interfacial atomic structure of twisted few-layer graphene

Ryo Ishikawa, Nathan R. Lugg, Kazutoshi Inoue, Hidetaka Sawada, Takashi Taniguchi, Naoya Shibata, Yuichi Ikuhara

研究成果: Article査読

9 被引用数 (Scopus)

抄録

A twist in bi-or few-layer graphene breaks the local symmetry, introducing a number of intriguing physical properties such as opening new bandgaps. Therefore, determining the twisted atomic structure is critical to understanding and controlling the functional properties of graphene. Combining low-angle annular dark-field electron microscopy with image simulations, we directly determine the atomic structure of twisted few-layer graphene in terms of a moire superstructure which is parameterized by a single twist angle and lattice constant. This method is shown to be a powerful tool for accurately determining the atomic structure of two-dimensional materials such as graphene, even in the presence of experimental errors. Using coincidence-site-lattice and displacement-shift-complete theories, we show that the in-plane translation state between layers is not a significant structure parameter, explaining why the present method is adequate not only for bilayer graphene but also a few-layered twisted graphene.

本文言語English
論文番号21273
ジャーナルScientific reports
6
DOI
出版ステータスPublished - 2016 2月 18

ASJC Scopus subject areas

  • 一般

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