抄録
The initial stage of SiO2/Si interface formation on an atomically flat hydrogen-terminated Si(100)-2 × 1 surface was studied by X-ray photoelectron spectroscopy. The following results were obtained: 1) the initial stage of interface formation does not depend on the initial surface morphology, 2) the interface layer becomes continuous at the oxide film thickness of 0.5 nm, and 3) at thicknesses greater than this the deviation from an atomically flat interface increases with the progress of oxidation, however, an abrupt compositional transition occurs.
本文言語 | English |
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ホスト出版物のタイトル | Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers |
編集者 | Seigo Tarucha, Yasuhiko Arakawa, Masao Fukuma, Kazuhito Furuya, Yoshiji Horikoshi, al et al |
Place of Publication | Minato-ku, Japan |
出版社 | JJAP |
ページ | 707-711 |
ページ数 | 5 |
巻 | 34 |
版 | 2 B |
出版ステータス | Published - 1995 2月 |
イベント | Proceedings of the 1994 International Conference on Solid State Devices and Materials (SSDM'94) - Yokohama, Jpn 継続期間: 1994 8月 23 → 1994 8月 26 |
Other
Other | Proceedings of the 1994 International Conference on Solid State Devices and Materials (SSDM'94) |
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City | Yokohama, Jpn |
Period | 94/8/23 → 94/8/26 |
ASJC Scopus subject areas
- 工学(全般)