Initial stage of oxidation of hydrogen-terminated Si(100)-2 × 1 surface

Takeshi Aiba, Ken Yamauchi, Yuichi Shimizu, Naoto Tate, Masatake Katayama, Takeo Hattori

    研究成果: Chapter

    41 被引用数 (Scopus)

    抄録

    The initial stage of SiO2/Si interface formation on an atomically flat hydrogen-terminated Si(100)-2 × 1 surface was studied by X-ray photoelectron spectroscopy. The following results were obtained: 1) the initial stage of interface formation does not depend on the initial surface morphology, 2) the interface layer becomes continuous at the oxide film thickness of 0.5 nm, and 3) at thicknesses greater than this the deviation from an atomically flat interface increases with the progress of oxidation, however, an abrupt compositional transition occurs.

    本文言語English
    ホスト出版物のタイトルJapanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers
    編集者Seigo Tarucha, Yasuhiko Arakawa, Masao Fukuma, Kazuhito Furuya, Yoshiji Horikoshi, al et al
    Place of PublicationMinato-ku, Japan
    出版社JJAP
    ページ707-711
    ページ数5
    34
    2 B
    出版ステータスPublished - 1995 2月
    イベントProceedings of the 1994 International Conference on Solid State Devices and Materials (SSDM'94) - Yokohama, Jpn
    継続期間: 1994 8月 231994 8月 26

    Other

    OtherProceedings of the 1994 International Conference on Solid State Devices and Materials (SSDM'94)
    CityYokohama, Jpn
    Period94/8/2394/8/26

    ASJC Scopus subject areas

    • 工学(全般)

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