Infrared spectroscopy of pentacene thin film on SiO 2 surface

Yoshinobu Hosoi, Koshi Okamura, Yasuo Kimura, Hisao Ishii, Michio Niwano

研究成果: Conference article

30 引用 (Scopus)

抜粋

The thin film of pentacene on a SiO 2 surface has been investigated by infrared spectroscopy in the multiple internal reflections (MIR) mode. It was found that the molecules in the monolayer are arranged with their molecular axes perpendicular to the surface, and that this arrangement is conserved during film growth up to a 70-nm thickness. In addition, the assignment of the infrared active vibrational modes is discussed.

元の言語English
ページ(範囲)607-610
ページ数4
ジャーナルApplied Surface Science
244
発行部数1-4
DOI
出版物ステータスPublished - 2005 5 15
イベント12th International Conference on Solid Films and Surfaces - Hammatsu, Japan
継続期間: 2004 6 212004 6 25

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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  • これを引用

    Hosoi, Y., Okamura, K., Kimura, Y., Ishii, H., & Niwano, M. (2005). Infrared spectroscopy of pentacene thin film on SiO 2 surface Applied Surface Science, 244(1-4), 607-610. https://doi.org/10.1016/j.apsusc.2004.10.131