抄録
The infrared emission spectra of CaF2-CaO-SiO2 melt were investigated by a method combining infrared emission spectroscopy and the hot-filament technique. Emission for spectra related to Si-O bond can be observed by this in situ technique. The influence of SiO2 and fluoride content on the spectrum was investigated, and the emission attributable to bonds corresponding to silicon-bridging oxygen and silicon-non bridging oxygen was discussed. Results suggest that fluoride ion dominantly substitutes for a non-bridging bond in low SiO2 concentration region. The structure of silicate was compared with calculated infrared emission of Si-F-O.
本文言語 | English |
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ページ(範囲) | 739-743 |
ページ数 | 5 |
ジャーナル | Isij International |
巻 | 40 |
号 | 8 |
DOI | |
出版ステータス | Published - 2000 |
外部発表 | はい |
ASJC Scopus subject areas
- 材料力学
- 機械工学
- 金属および合金
- 材料化学