@inproceedings{c05649a6fc1341338d9e8b5c9b9576cc,
title = "Influence of temperature-dependent refractive index on thermal radiation from surface gratings",
abstract = "We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.",
keywords = "Complex refractive index, Ellipsometry, High temperature, RCWA, Surface grating",
author = "Hiroo Yugami and Takahiro Kamikawa and Yoshiaki Kanamori",
year = "2006",
doi = "10.1117/12.662760",
language = "English",
isbn = "0819462535",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Photonics for Solar Energy Systems",
note = "Photonics for Solar Energy Systems ; Conference date: 05-04-2006 Through 06-04-2006",
}