InAs/AlGaSb piezoresistive cantilever for sub-angstrom scale displacement detection

Lionel F. Houlet, Hiroshi Yamaguchi, Sen Miyashita, Yoshiro Hirayama

研究成果: Article

3 引用 (Scopus)

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We report on the fabrication and characterization of 0.3-μm-thick piezoresistive cantilevers based on the InAs/AlGaSb heterostructure. The dependence of the displacement resolution on the cantilever size, which ranges from 20×10 to 2×1 μm2, has been studied by a novel characterization method using an atomic force microscope. The results show that downscaling the cantilevers improves their performances, and an optimum resolution of 0.26Å/Hz0.5 was obtained with a 3×1.5 μm2 cantilever at a modulation frequency of 714 Hz. A finite-element simulator allowed the calculation of the resonance frequencies and a maximum value of 20.5 MHz was obtained for the 3 × 1.5μm 2 cantilever.

元の言語English
ページ(範囲)L424-L426
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
43
発行部数3 B
出版物ステータスPublished - 2004 3 15
外部発表Yes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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