In situ vacuum ellipsometry approach to investigation of glass transition behavior in ionic liquid thin films

研究成果: Article査読

抄録

Glass transition behavior of vacuum-deposited ionic liquid thin films was investigated by in situ ellipsometry. The glass transition temperatures of [omim][TFSA] thin films (≥50 nm) were determined from the temperature-dependent light ellipticity and found to be almost identical to the bulk value regardless of the thickness. Moreover, it was suggested that the sequentially deposited [omim][PF6]/[omim][TFSA] bi-layer film became homogeneous and had one glass transition temperature close to the value of the corresponding bulk mixture for each weight fraction, which could be explained by the theoretical fast mutual diffusion of ILs within the film relative to the total deposition time.

本文言語English
論文番号137691
ジャーナルChemical Physics Letters
754
DOI
出版ステータスPublished - 2020 9月
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)
  • 物理化学および理論化学

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