In-situ TEM observation of interfacial reactions in the Zr/Si system

Hiroyuki Tanaka, Toyohiko J. Konno, Robert Sinclair

研究成果: Conference article

1 引用 (Scopus)

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The interfacial reactions in the Zr/Si system were studied by in-situ cross-section TEM including high resolution mode. The reactions consisted of formation of an amorphous interlayer followed by the nucleation and growth of crystalline ZrSi2. The development of the amorphous layer was found to involve two different stages. The ZrSi2 was also found to grow layer-by-layer into the Si via a ledge mechanism.

元の言語English
ページ(範囲)481-485
ページ数5
ジャーナルMaterials Research Society Symposium - Proceedings
337
DOI
出版物ステータスPublished - 1994
外部発表Yes
イベントProceedings of the 1994 MRS Spring Meeting - San Francisco, CA, USA
継続期間: 1994 4 41994 4 8

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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