Improvement of spatial resolution in phase-contrast X-ray computed tomography

Atsushi Momose, Ichiro Koyama, Keiichi Hirano

研究成果: Conference article査読

4 被引用数 (Scopus)

抄録

Image quality of phase-contrast X-ray computed tomogram was evaluated by comparing tomograms obtained by using triple Lane-case X-ray interferometers with a thin or a thick crystal wafer. It was confirmed that the spatial resolution was improved when the wafer is thinned. A simulation study by means of the Takagi-Taupin equation was also carried out for theoretical understanding. According to the wavefront modulation transfer function calculated for Laue-case diffraction, it is suggested that using an interferometer with a thin wafer tends to improve image quality. However, a new problem is pointed out that the accuracy in quantitative measurement of high-frequency phase modulation is not secured even when the wafer is thinned.

本文言語English
ページ(範囲)71-81
ページ数11
ジャーナルProceedings of SPIE - The International Society for Optical Engineering
4503
DOI
出版ステータスPublished - 2001 12月 1
外部発表はい
イベントDevelopments in X-Ray Tomography III - San Diego, CA, United States
継続期間: 2001 8月 22001 8月 3

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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