Imaging of current concentration in sub-linear width dependent quantum Hall breakdown

K. Oto, T. Katagiri, M. Dohi, R. Yonamine, T. Ishihara

研究成果: Conference contribution

抜粋

We have investigated the current distribution at quantum Hall effect (QHE) plateau to study mechanisms of the QHE breakdown whose critical current shows sub-linear dependence on the channel width. A Hall-bar device made from GaAs/AlGaAs on a scanning stage is locally illuminated by an infrared laser light to map the QHE breakdown critical current with local photo-excitation. The spatial profile of the critical current reveals the current concentration at the center region of the sample.

元の言語English
ホスト出版物のタイトルPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
ページ661-662
ページ数2
DOI
出版物ステータスPublished - 2007 12 1
外部発表Yes
イベント28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
継続期間: 2006 7 242006 7 28

出版物シリーズ

名前AIP Conference Proceedings
893
ISSN(印刷物)0094-243X
ISSN(電子版)1551-7616

Other

Other28th International Conference on the Physics of Semiconductors, ICPS 2006
Austria
Vienna
期間06/7/2406/7/28

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • これを引用

    Oto, K., Katagiri, T., Dohi, M., Yonamine, R., & Ishihara, T. (2007). Imaging of current concentration in sub-linear width dependent quantum Hall breakdown. : Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B (pp. 661-662). (AIP Conference Proceedings; 巻数 893). https://doi.org/10.1063/1.2730064