Imaging of current concentration in sub-linear width dependent quantum Hall breakdown

K. Oto, T. Katagiri, M. Dohi, R. Yonamine, T. Ishihara

研究成果: Conference contribution

抄録

We have investigated the current distribution at quantum Hall effect (QHE) plateau to study mechanisms of the QHE breakdown whose critical current shows sub-linear dependence on the channel width. A Hall-bar device made from GaAs/AlGaAs on a scanning stage is locally illuminated by an infrared laser light to map the QHE breakdown critical current with local photo-excitation. The spatial profile of the critical current reveals the current concentration at the center region of the sample.

本文言語English
ホスト出版物のタイトルPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
ページ661-662
ページ数2
DOI
出版ステータスPublished - 2007 12月 1
外部発表はい
イベント28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
継続期間: 2006 7月 242006 7月 28

出版物シリーズ

名前AIP Conference Proceedings
893
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other28th International Conference on the Physics of Semiconductors, ICPS 2006
国/地域Austria
CityVienna
Period06/7/2406/7/28

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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