### 抜粋

A theory for scanning nonlinear dielectric microscopy (SNDM) and its application to the quantitative evaluation of the linear and nonlinear dielectric constants of dielectric materials are described. First, a general theorem for the capacitance variation under an applied electric field is derived and a capacitance variation susceptibility S_{nl}, which is a very useful parameter for the quantitative measurement of nonlinear dielectric constants, is defined. This S_{nl} is independent of the tip radius, and therefore the sensitivity of the SNDM probe does not change, even if a tip with a smaller radius is selected to obtain a finer resolution. Using the theoretical results and the data taken by SNDM, the quantitative linear and nonlinear dielectric properties of several dielectric materials were successfully determined. From the calculation of a one-dimensional image of a 180° c-c domain boundary, it is demonstrated that the SNDM has an atomic scale resolution.

元の言語 | English |
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ページ（範囲） | 133-142 |

ページ数 | 10 |

ジャーナル | Integrated Ferroelectrics |

巻 | 32 |

発行部数 | 1-4 |

DOI | |

出版物ステータス | Published - 2001 |

イベント | 12th International Symposium on Integrated Ferroelectrics - Aachen, Germany 継続期間: 2000 3 12 → 2000 3 15 |

### ASJC Scopus subject areas

- Electronic, Optical and Magnetic Materials
- Control and Systems Engineering
- Ceramics and Composites
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry

## フィンガープリント Image production mechanism for scanning nonlinear dielectric microscopy with super high resolution and its application to quantitative evaluation of linear and nonlinear dielectric properties of ferroelectric materials' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

## これを引用

*Integrated Ferroelectrics*,

*32*(1-4), 133-142. https://doi.org/10.1080/10584580108215684