Image production mechanism for scanning nonlinear dielectric microscopy with super high resolution and its application to quantitative evaluation of linear and nonlinear dielectric properties of ferroelectric materials

Y. Cho, K. Ohara, S. Kazuta, H. Odagawa

研究成果: Conference article査読

7 被引用数 (Scopus)

抄録

A theory for scanning nonlinear dielectric microscopy (SNDM) and its application to the quantitative evaluation of the linear and nonlinear dielectric constants of dielectric materials are described. First, a general theorem for the capacitance variation under an applied electric field is derived and a capacitance variation susceptibility Snl, which is a very useful parameter for the quantitative measurement of nonlinear dielectric constants, is defined. This Snl is independent of the tip radius, and therefore the sensitivity of the SNDM probe does not change, even if a tip with a smaller radius is selected to obtain a finer resolution. Using the theoretical results and the data taken by SNDM, the quantitative linear and nonlinear dielectric properties of several dielectric materials were successfully determined. From the calculation of a one-dimensional image of a 180° c-c domain boundary, it is demonstrated that the SNDM has an atomic scale resolution.

本文言語English
ページ(範囲)133-142
ページ数10
ジャーナルIntegrated Ferroelectrics
32
1-4
DOI
出版ステータスPublished - 2001
イベント12th International Symposium on Integrated Ferroelectrics - Aachen, Germany
継続期間: 2000 3 122000 3 15

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 制御およびシステム工学
  • セラミックおよび複合材料
  • 凝縮系物理学
  • 電子工学および電気工学
  • 材料化学

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