Image observation of diffraction spots using FZP and coherent X-ray beam

Takuya Suzuki, Hidekazu Takano, Akihisa Takeuchi, Kentaro Uesugi, Yoshiki Kohmura, Masashi Hasegawa, Kazuharu Yoshizuka, Yoshio Suzuki

研究成果: Conference contribution

抄録

New small angle X-ray dispersion speckle method by the condensing optical system using FZP (Fresnel zone plate) was performed. And single crystal diffraction spot image was observed using this optical system. High photon flux with the FZP of 100-micron-diameter is obtained than that with a 5-micron-diameter pinhole. S/N ratio of data improved and measurement time also became short. The minimum beam size focused with the FZP was 0.25 μm. The speckle image resulting from the non-ordering structure and periodic structure of 10nm order is successfully observed. This optical system was applicable also to diffraction spot image observation. We show a possibility that the information of the periodic and/or random structural analysis with sub-μm order which were unsuitable with the conventional single crystal x-ray diffraction analysis.

本文言語English
ホスト出版物のタイトルSynchrotron Radiation Instrumentation
ホスト出版物のサブタイトル8th International Conference on Synchrotron Radiation Instrumentation
出版社American Institute of Physics Inc.
ページ1332-1335
ページ数4
ISBN(電子版)0735401799
DOI
出版ステータスPublished - 2004 5 12
外部発表はい
イベント8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
継続期間: 2003 8 252003 8 29

出版物シリーズ

名前AIP Conference Proceedings
705
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period03/8/2503/8/29

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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