Identification of information leakage spots on a cryptographic device with an RSA processor

Olivier Meynard, Yu-Ichi Hayashi, Naofumi Homma, Sylvain Guilley, Jean Luc Danger

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

This paper investigates a relationship between the intensity of EM radiation and that of EM information leakage on a cryptographic device. For this purpose, we first observe an EM-field map on a cryptographic device by an EM scanning system, and then perform simple electromagnetic analysis (SEMA) experiments at some distinct points on the device including over the module. The target device considered here is a Side-channel Attack Standard Evaluation Board (SASEBO) with an RSA hardware implemented in an FPGA. Through the experiment, we demonstrate which points are effective for EM information leakage. The result suggests that the position of greatest EM intensity is not always the most effective point in EM information leakage.

本文言語English
ホスト出版物のタイトルEMC 2011 - Proceedings
ホスト出版物のサブタイトル2011 IEEE International Symposium on Electromagnetic Compatibility
ページ773-778
ページ数6
DOI
出版ステータスPublished - 2011 10月 24
イベント2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011 - Long Beach, CA, United States
継続期間: 2011 8月 142011 8月 19

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
ISSN(印刷版)1077-4076

Other

Other2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011
国/地域United States
CityLong Beach, CA
Period11/8/1411/8/19

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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