Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules

Atsushi Masuda; Naomi Uchiyama; Chizuko Yamamoto

Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules

Atsushi Masuda, Naomi Uchiyama, Chizuko Yamamoto

研究成果: Conference contribution

抄録

Degradation behavior of thin-film Si photovoltaic modules by hygrothermal and thermal cyclic stresses was studied. Degradation progresses along the scribe lines for integration and from the slit on back sheet for taking out interconnector ribbons. Not only acetic acid generated by hydrolysis reaction between ethylene-vinyl acetate encapsulant and penetrating water vapor but also water vapor itself is the origin of degradation. It is important that high-barrier ability back sheet with low water-vapor transmission rate is employed and also important how suppress the water-vapor ingress from the slit on the back sheet. On the other hand, thin-film Si photovoltaic modules show high tolerance to thermal cyclic stress since only a few interconnector ribbons are employed.

本文言語	English
ホスト出版物のタイトル	AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices
ホスト出版物のサブタイトル	TFT Technologies and FPD Materials, Proceedings
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	98-99
ページ数	2
ISBN（電子版）	9784990875336
出版ステータス	Published - 2017 8月 8
外部発表	はい
イベント	24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017 - Kyoto, Japan 継続期間: 2017 7月 4 → 2017 7月 7

出版物シリーズ

名前	AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings

Conference

Conference	24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017
国/地域	Japan
City	Kyoto
Period	17/7/4 → 17/7/7

ASJC Scopus subject areas

電子工学および電気工学
計算理論と計算数学

UN SDG

この成果は、次の持続可能な開発目標に貢献しています

他のファイルとリンク

引用スタイル

Masuda, A., Uchiyama, N., & Yamamoto, C. (2017). Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules. In AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings (pp. 98-99). [8006089] (AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings). Institute of Electrical and Electronics Engineers Inc..

Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules. / Masuda, Atsushi; Uchiyama, Naomi; Yamamoto, Chizuko.

AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. p. 98-99 8006089 (AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings).

研究成果: Conference contribution

Masuda, A, Uchiyama, N & Yamamoto, C 2017, Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules. in AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings., 8006089, AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 98-99, 24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017, Kyoto, Japan, 17/7/4.

Masuda A, Uchiyama N, Yamamoto C. Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules. In AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. p. 98-99. 8006089. (AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings).

Masuda, Atsushi ; Uchiyama, Naomi ; Yamamoto, Chizuko. / Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules. AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 98-99 (AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings).

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abstract = "Degradation behavior of thin-film Si photovoltaic modules by hygrothermal and thermal cyclic stresses was studied. Degradation progresses along the scribe lines for integration and from the slit on back sheet for taking out interconnector ribbons. Not only acetic acid generated by hydrolysis reaction between ethylene-vinyl acetate encapsulant and penetrating water vapor but also water vapor itself is the origin of degradation. It is important that high-barrier ability back sheet with low water-vapor transmission rate is employed and also important how suppress the water-vapor ingress from the slit on the back sheet. On the other hand, thin-film Si photovoltaic modules show high tolerance to thermal cyclic stress since only a few interconnector ribbons are employed.",

author = "Atsushi Masuda and Naomi Uchiyama and Chizuko Yamamoto",

note = "Funding Information: This study was in part supported by the “Consortium Study on Fabrication and Characterization of Solar Cell Modules with Long Life and High Reliability” at National Institute of Advanced Industrial Science and Technology and also by New Energy and Industrial Technology Development Organization.; 24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017 ; Conference date: 04-07-2017 Through 07-07-2017",

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AU - Masuda, Atsushi

AU - Uchiyama, Naomi

AU - Yamamoto, Chizuko

N1 - Funding Information: This study was in part supported by the “Consortium Study on Fabrication and Characterization of Solar Cell Modules with Long Life and High Reliability” at National Institute of Advanced Industrial Science and Technology and also by New Energy and Industrial Technology Development Organization.

PY - 2017/8/8

Y1 - 2017/8/8

N2 - Degradation behavior of thin-film Si photovoltaic modules by hygrothermal and thermal cyclic stresses was studied. Degradation progresses along the scribe lines for integration and from the slit on back sheet for taking out interconnector ribbons. Not only acetic acid generated by hydrolysis reaction between ethylene-vinyl acetate encapsulant and penetrating water vapor but also water vapor itself is the origin of degradation. It is important that high-barrier ability back sheet with low water-vapor transmission rate is employed and also important how suppress the water-vapor ingress from the slit on the back sheet. On the other hand, thin-film Si photovoltaic modules show high tolerance to thermal cyclic stress since only a few interconnector ribbons are employed.

AB - Degradation behavior of thin-film Si photovoltaic modules by hygrothermal and thermal cyclic stresses was studied. Degradation progresses along the scribe lines for integration and from the slit on back sheet for taking out interconnector ribbons. Not only acetic acid generated by hydrolysis reaction between ethylene-vinyl acetate encapsulant and penetrating water vapor but also water vapor itself is the origin of degradation. It is important that high-barrier ability back sheet with low water-vapor transmission rate is employed and also important how suppress the water-vapor ingress from the slit on the back sheet. On the other hand, thin-film Si photovoltaic modules show high tolerance to thermal cyclic stress since only a few interconnector ribbons are employed.

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BT - AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices

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Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules

抄録

出版物シリーズ

Conference

ASJC Scopus subject areas

UN SDG

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