Higher-order moment of single-electron current noise in a double quantum dot

T. Fujisawa, T. Hayashi, Yoshiro Hirayama

研究成果: Conference contribution

抄録

Charge detection measurement on a double quantum dot allows bidirectional counting of single-electrons for extremely small current. We discuss higher-order moment of current noise in single-electron transport through a double quantum dot, and find that the third order moment is insensitive to the thermal noise. The counting statistics provides useful technique for studying correlated transport.

本文言語English
ホスト出版物のタイトルPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
ページ753-754
ページ数2
DOI
出版ステータスPublished - 2007 12 1
イベント28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
継続期間: 2006 7 242006 7 28

出版物シリーズ

名前AIP Conference Proceedings
893
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other28th International Conference on the Physics of Semiconductors, ICPS 2006
国/地域Austria
CityVienna
Period06/7/2406/7/28

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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