TY - JOUR
T1 - High Speed Scanning Ion Conductance Microscopy for Quantitative Analysis of Nanoscale Dynamics of Microvilli
AU - Ida, Hiroki
AU - Takahashi, Yasufumi
AU - Kumatani, Akichika
AU - Shiku, Hitoshi
AU - Matsue, Tomokazu
N1 - Funding Information:
This work is supported by Development of Systems and Technology for Advanced Measurement and Analysis from AMED (The Japan Agency for Medical Research and Development)-SENTAN, and ALCA and PREST from the Japan Science and Technology Agency (JST), a Grant-in-Aid for Scientific Research (A) (16H02280), a Grant-in-Aid for Scientific Research (B) (15H03542), a Grant-in-Aid for Young Scientists (A) (15H05422 and 16H06042) from the Japan Society for the Promotion of Science (JSPS) and Nakatani Foundation, Grant-in-Aid for JSPS Research Fellow, and a Grant-in-Aid of Tohoku University Institute for Promoting Graduate Degree Programs Division for Interdisciplinary Advanced Research and Education.
Publisher Copyright:
© 2017 American Chemical Society.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/6/6
Y1 - 2017/6/6
N2 - Observation of nanoscale structure dynamics on cell surfaces is essential to understanding cell functions. Hopping-mode scanning ion conductance microscopy (SICM) was used to visualize the topography of fragile convoluted nanoscale structures on cell surfaces under noninvasive conditions. However, conventional hopping mode SICM does not have sufficient temporal resolution to observe cell-surface dynamics in situ because of the additional time required for performing vertical probe movements of the nanopipette. Here, we introduce a new scanning algorithm for high speed SICM measurements using low capacitance and high-resonance-frequency piezo stages. As a result, a topographic image is taken within 18 s with a 64 × 64 pixel resolution at 10 × 10 μm. The high speed SICM is applied to the characterization of microvilli dynamics on surfaces, which shows clear structural changes after the epidermal growth factor stimulation.
AB - Observation of nanoscale structure dynamics on cell surfaces is essential to understanding cell functions. Hopping-mode scanning ion conductance microscopy (SICM) was used to visualize the topography of fragile convoluted nanoscale structures on cell surfaces under noninvasive conditions. However, conventional hopping mode SICM does not have sufficient temporal resolution to observe cell-surface dynamics in situ because of the additional time required for performing vertical probe movements of the nanopipette. Here, we introduce a new scanning algorithm for high speed SICM measurements using low capacitance and high-resonance-frequency piezo stages. As a result, a topographic image is taken within 18 s with a 64 × 64 pixel resolution at 10 × 10 μm. The high speed SICM is applied to the characterization of microvilli dynamics on surfaces, which shows clear structural changes after the epidermal growth factor stimulation.
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U2 - 10.1021/acs.analchem.7b00584
DO - 10.1021/acs.analchem.7b00584
M3 - Article
C2 - 28481079
AN - SCOPUS:85020892965
VL - 89
SP - 6015
EP - 6020
JO - Analytical Chemistry
JF - Analytical Chemistry
SN - 0003-2700
IS - 11
ER -